- Computed order tracking measurements
- Real-time octave measurements (complies with ANSI Sl.ll)
- Swept-sine measurements
- Curve fit/synthesis
- Arbitrary waveform source
Measurement options expand the electronics test capability of the standard Agilent/HP 35665A into other application areas. With the addition of HP Instrument BASIC programs, even the most complex applications can be reduced to a single keystroke. The multi-faceted measurement modes of the Agilent/HP 35665A have the measurement functionality of a spectrum analyzer, network analyzer, acoustic sound-level meter, acoustic intensity analyzer, vibration analyzer, audio oscilloscope and amplitude domain analyzer in a single package.
Features
- 1-channel at 102.4 kHz, 2 channels at 51.2 kHz
- 100, 200, 400, 800 lines of resolution
- Built in 3.5 inch floppy disk
- Tachometer input
- Source: Random, burst random, pink noise, sine, swept-sine, arbitrary, periodic chirp, burst chirp
- 3.2 M Sample time-capture buffer (optional)
- Measurements: linear spectrum, cross-spectrum, power spectral density, frequency response, time waveform, auto-correlation, cross-correlation, histogram, PDF, CDF
- Optional real-time octave, computed order tracking, swept-sine, curve fit, synthesis, and arbitrary source.
- One Channel Mode (CH. 1): 102.4 kHz
- Two Channel Mode (Ch 1 & 2): 51.2 kHz
- 100, 200, 400 or 800 lines resolution
- Frequency resolution = frequency span/number of lines resolution
- Minimum frequency resolution
- One Channel Mode: 244 uHz
- Two Channel Mode: 122 uHz
- One Channel Mode: 102.4 kHz to 0.19531 Hz
- Two Channel Mode: 51.2 kHz to 0.097656 Hz
- Real Time Bandwidth
- Fast Average On: >=12.8 kHz
- 401 point FFT display, fast average on
- One Channel mode: >=33 averages/second (typical)
- Two channel mode: >=15 averages/second (typical)
- DISPLAY UPDATE RATE: >=8 updates/second (typical)
- 401 point FFT display, fast average off
Opzioni
- 1C2: HP Instrument BASIC
- 1D0: Computed order Tracking
- 1D1: Real-time Octave Measurements
- 1D2: Swept-Sine Measurements
- 1D3: Curve fit/Synthesis
- 1D4: Arbitrary Waveform Surce